Design, Analysis and Test of Logic Circuits Under Uncertainty PDF
By:Smita Krishnaswamy,Igor L. Markov,John P. Hayes
Published on 2012-09-21 by Springer Science & Business Media
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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Book which was published by Springer Science & Business Media since 2012-09-21 have ISBNs, ISBN 13 Code is 9789048196449 and ISBN 10 Code is 9048196442
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