ToF-SIMS PDF
By:J. C. Vickerman,David Briggs
Published on 2013 by IM Publications
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
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Book ID of ToF-SIMS's Books is yFUHFEipgcYC, Book which was written byJ. C. Vickerman,David Briggshave ETAG "aN4r7YD56P0"
Book which was published by IM Publications since 2013 have ISBNs, ISBN 13 Code is 9781906715175 and ISBN 10 Code is 1906715173
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Book which have "732 Pages" is Printed at BOOK under CategoryMass spectrometry
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